Amient-induced defect states at a-Si:H/ITO interfaces
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OpenAlex topics: Thin-Film Transistor Technologies · CCD and CMOS Imaging Sensors · Thermography and Photoacoustic Techniques
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References (8)
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1. Hoheisel · J. Non-Cryst. Solids · 1987 · 90 · 24310.1016/S0022-3093(87)80420-9 ↗
2. Hoheisel · J. Appl. Phys. · 1989
3. Brutscher · Solid-St. Electron. · 1988 · 31 · 8710.1016/0038-1101(88)90089-5 ↗
4. Mitwalsky · 1988 · Vol. 2 · 107
5. Rosan · 1986 · 70 · 683
6. Hoheisel · J. Non-Cryst. Solids · 1987 · 97&98 · 95910.1016/0022-3093(87)90231-6 ↗
7. Wieczorek · phys. stat. sol. (a) · 1988 · 109 · 24510.1002/pssa.2211090126 ↗
8. Stutzmann · Phys. Rev. B · 1985 · 32 · 2310.1103/PhysRevB.32.23 ↗