Observation of different types of dangling bonds and their photo-creation in a-Si:H, as elucidated by endor measurements
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Surface Roughness and Optical Measurements · Optical Coatings and Gratings
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. Yokomichi · Solid State Commun. · 1987 · 61 · 69710.1016/0038-1098(87)90719-8 ↗
2. Yokomichi · Solid State Commun. · 1987 · 63 · 62910.1016/0038-1098(87)90868-4 ↗
3. Watkins · Phys. Rev. · 1964 · 134 · A135910.1103/PhysRev.134.A1359 ↗
4. Biegelsen · Phys. Rev. · 1986 · B33 · 300610.1103/PhysRevB.33.3006 ↗
5. Ishii · Jpn. J. Appl. Phys. · 1981 · 20 · L67310.1143/JJAP.20.L673 ↗
6. Wu · J. Non-Cryst. Solids · 1987 · 90 · 15110.1016/S0022-3093(87)80402-7 ↗
7. Yamasaki · 1987