A two-dimensional visible/infrared detector based on μc-Si:H p–i–n structures
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OpenAlex topics: CCD and CMOS Imaging Sensors · Thin-Film Transistor Technologies · Astronomical Observations and Instrumentation
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References (12)
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1. Kanicki · Mat. Res. Soc. Symp. Proc · 1989 · 149 · 23910.1557/PROC-149-239 ↗
2. Weisfield · Mat. Res. Soc. Symp. Proc. · 1990 · 192 · 42310.1557/PROC-192-423 ↗
3. Torkel · Proc. IRE · 1956 · 43 · 474
4. T. Takeda, in: J. Kanicki (Ed.), Amorphous and Microcrystalline Semiconductor Devices, Vol. 1, Chap. 9, Artech House, Boston, 1991.
5. Fortunato · Mat. Res. Soc. Symp. Proc. · 1993 · 297 · 98110.1557/PROC-297-981 ↗
6. Vieira · Appl. Phys. Lett. · 1997 · 70 · 22010.1063/1.118371 ↗
7. Koynov · J. Non-Cryst. Solids · 1996 · 198–200 · 101210.1016/0022-3093(96)00162-7 ↗
8. Vieira · Thin Solid Films · 1997 · 296 · 16410.1016/S0040-6090(96)09339-X ↗
9. Krankenhagen · Solid State Phenomena · 1995 · 47 · 60710.4028/www.scientific.net/SSP.47-48.607 ↗
10. M. Vieira, A. Fantoni, S. Koynov, R. Schwarz, Photodetectors: materials and devices II, Proc. of SPIE, Vol. 2999, 1997, p. 183.10.1117/12.271189 ↗
11. Vieira · Mat. Res. Soc. Symp. Proc. · 1995 · 377 · 98110.1557/PROC-377-839 ↗
12. Chen · J. Appl. Phys. · 1988 · 64 · 222410.1063/1.341689 ↗