journal article·1983-12

Back surface reflected electroabsorption as a new characterization method of internal potential in a-Si homo- and heterojunction

Shuichi Nonomura, Koji Fukumoto, Hiroaki Okamoto, Yoshihiro Hamakawa

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Silicon Nanostructures and Photoluminescence

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (6)

Show source-provided references
1. Caldona · 1969
2. Weiser · Phys. Stat. Solid · 1969 · 35 · 74710.1002/pssb.19690350225 ↗
3. Okamoto · Surface Sci. · 1979 · 24 · 48610.1016/0039-6028(79)90425-4 ↗
4. Freeman · Bull. Amer. Phys. Soc. · 1979 · 24 · 339
5. Tawada · J. Appl. Phys. · 1982 · 53 · 527310.1063/1.331363 ↗
6. Nonomura · Appl. Phys. A · 1983