journal article·1991

Properties of GeH4 (SiH4) plasmas for deposition of device-quality a-Ge:H (a-Si:H) material

W. Kasper, R. Plättner, J. Eichmeier

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Semiconductor materials and devices · Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (15)

Show source-provided references
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3. Gallagher · J.Appl.Phys. · 1988 · 63 · 240610.1063/1.341034 ↗
4. Karg · Solar Energy Materials · 1991 · 22 · 16910.1016/0165-1633(91)90015-D ↗
5. Kusian · R.Plättner EC PVSEC-10 Lisbon · 1991
6. Kusian · W.Kasper PVSEC-5 Kyoto · 1990
7. Plättner · 1991
8. Kausche · EC PVSEC-9 Freiburg · 1989
9. Sabadil · Plasma Chem. and Plasma Processing · 1988 · 8 · 42510.1007/BF01016058 ↗
10. W.Kasper, H.Böhm, B.Hirschauer, to be published in J.Appl.Phys.
11. Capitelli · Plasma Chem. and Plasma Processing · 1988 · 8 · 39910.1007/BF01016057 ↗
12. Perkins · J.Am.Chem.Soc. · 1979 · 101 · 110910.1021/ja00499a010 ↗
13. Capitelli · 1986
14. Omomori · J.Phys.D:Appl.Phys. · 1986 · 19 · 102910.1088/0022-3727/19/6/017 ↗
15. M.Hayashi, personal information (tentative GeH4 cross sections; uncertainty of the values about ± 30 %)