The use of the electron microprobe analyser for the study of the composition of the terminations of conducting filaments in MIM structures
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Phase-change materials and chalcogenides · Semiconductor materials and interfaces · Thin-Film Transistor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. A.E. Rakhshani, C.A. Hogarth and A.A. Abidi, J. Non-Crystalline Solids, to be published.
2. Uttecht · J. Non-Crystalline Solids · 1970 · 2 · 35910.1016/0022-3093(70)90151-1 ↗
3. Tanaka · J. Non-Crystalline Solids · 1973 · 12 · 10010.1016/0022-3093(73)90057-4 ↗
4. Electron Beam Microanalysis
5. Abidi · Thin Solid Films · 1974 · 22 · 20310.1016/0040-6090(74)90007-8 ↗