Gap state defects in hydrogenated amorphous silicon-carbon alloys studied by photothermal deflection spectroscopy
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OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies
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References (9)
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1. Munekata · Appl. Phys. Lett. · 1983 · 42 · 43210.1063/1.93960 ↗
2. Abeles · Phys. Rev. Lett. · 1983 · 51 · 200310.1103/PhysRevLett.51.2003 ↗
3. Amer · 1984 · Vol.:21 · 83
4. J. Tauc : in Amorphous and Liquid Semiconductors (New York: plenium) ch.4
5. Street · Appl. Phys. Lett. · 1983 · 43
6. Stutzmann · Phys, Rev. B. · 1985 · 32
7. Skumanich · Appl. Phys. Lett. · 1989 · 5410.1063/1.101231 ↗
8. Fathallah · Phil. Mag B · 1990 · 61 · 40310.1080/13642819008208643 ↗
9. Morimoto · Appl. Phys. Lett · 1982 · 53