journal article·1985-12

Characterization of junctions between transparent electrodes and a-Si:H

M. Hoheisel, H. Wieczorek, K. Kempter

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: CCD and CMOS Imaging Sensors · Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence

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References (7)

Show source-provided references
1. Holzenkämpfer · 1984 · 575
2. Kempter · 1985
3. Ohsawa · 1983 · 1963
4. Hentzell · Materials Lett. · 1985 · 3 · 25510.1016/0167-577X(85)90016-3 ↗
5. Thompson · Appl. Phys. Lett. · 1981 · 39 · 27410.1063/1.92670 ↗
6. Nemanich · Phys. Rev. · 1981 · B23 · 682810.1103/PhysRevB.23.6828 ↗
7. Steemers · Phil. Mag. · 1983 · B47 · L8310.1080/13642812.1983.11643270 ↗