Linear defects in post hydrogenated amorphous silicon evidenced by high resolution electron microscopy (HREM)
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Silicon Nanostructures and Photoluminescence
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References (7)
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1. Reimer · Phys. Rev. Lett. · 1980 · 44 · 19310.1103/PhysRevLett.44.193 ↗
2. R. Bellissent et al., this Conference
3. Brodsky · Solid State Comm. · 1980 · 36 · 5510.1016/0038-1098(80)90191-X ↗
4. Smith · J. of Microscopy · 1980 · 119 · 1910.1111/j.1365-2818.1980.tb04072.x ↗
5. Kleman · J. Phys. Lett. · 1983 · 44 · L 29510.1051/jphyslet:01983004408029500 ↗
6. Martinez · Solid State Comm. · 1982 · 44 · 147710.1016/0038-1098(82)90459-8 ↗
7. A. Chenevas-Paule, to be published in SEMICONDUCTORS and SEMIMETALS, Vol. 21.A.