journal article·1989-12

Temperature-dependent defect density measurements in hydrogenated amorphous silicon

Sufi Zafar, E.A Schiff

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Transition Metal Oxide Nanomaterials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (6)

Show source-provided references
1. Smith · Phys. Rev. Lett. · 1987 · 57 · 245010.1103/PhysRevLett.57.2450 ↗
2. Smith · 1988 · 409
3. R. A. Street and K. Winer, Phys. Rev. to be published.
4. X. Xu, A. Morimoto, M. Kumeda, and T. Shimizu, Materials Research Symposia Proceedings 149, in press.
5. Zafar · Phys. Rev. B · 1989 · 4010.1103/PhysRevB.40.5235 ↗
6. Baum · Phys. Rev. Lett. · 1986 · 56 · 137710.1103/PhysRevLett.56.1377 ↗