journal article·1985-12

Structural properties of a-SiC:H- and a-SiN:H-Alloys from XPS-analyses and IR-absorption

G.H. Bauer, H.-D. Mohring, G. Bilger, A. Eicke

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Advanced ceramic materials synthesis · Ga2O3 and related materials

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References (10)

Show source-provided references
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6. Shanks · phys. stat. sol. (b) · 1980 · 100 · 4310.1002/pssb.2221000103 ↗
7. Fujimoto · Jpn. J. Appl. Phys. · 1984 · 23 · 81010.1143/JJAP.23.810 ↗
8. Katayama · Philos. Mag. B · 1981 · 43 · 28310.1080/13642818108221899 ↗
9. Lee · J. Appl. Phys. · 1980 · 51 · 336510.1063/1.328049 ↗
10. Kärcher · Phys. Rev. B · 1984 · 30 · 189610.1103/PhysRevB.30.1896 ↗