journal article·1991

In situ study of the hydrogen rich overlayer at the a-Si:H surface by infrared ellipsometry

Nadine Blayo, Bernard Drevillon

Publisher page

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (9)

Show source-provided references
1. Ley · 1985 · 811
2. Lin · J. Appl. Phys. · 1988 · 64 · 18810.1063/1.341461 ↗
3. Maley · J. Non-Cryst. Solids · 1989 · 114 · 16310.1016/0022-3093(89)90100-2 ↗
4. Toyoshima · Appl. Phys. Lett. · 1990 · 57 · 102810.1063/1.103555 ↗
5. N. Blayo and B. Drévillon, Appl. Phys. Lett. (in print)
6. Antoine · J. Appl. Phys. · 1987 · 61 · 250110.1063/1.337924 ↗
7. Blayo · Physica B · 1991 · 170 · 56610.1016/0921-4526(91)90179-I ↗
8. Wilbers · Meas. Sci. Technol. · 1990 · 1 · 132610.1088/0957-0233/1/12/012 ↗
9. N. Blayo and B. Drévillon, Surf. Sci. (in print)