Multiple thermal cycling and phase transitions in Ge-Sb-Te materials
Source abstract
Abstract
Abstract Structural transformations in Ge2Sb2Te5 thin films fabricated by the thermal evaporation in vacuum (TEV) and DC magnetron sputtering (MS) were studied by the differential scanning calorimetry (DSC). Multiple DSC measurements revealed the appearance of reproducible endothermic peaks in all samples in the temperature range of 390–425 °C (one for TEV and two for MS films, respectively). Investigations by X-ray diffraction, scanning and transmission electron microscopes were carried out, and the natures of these endothermic peaks were discussed.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Phase-change materials and chalcogenides · Chalcogenide Semiconductor Thin Films · Nonlinear Optical Materials Studies
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References (16)
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