Temperature dependence of quantised resistance steps in electroformed metal–a-Si:H–metal structures
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Semiconductor materials and interfaces · GaN-based semiconductor devices and materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (6)
Show source-provided references
1. Hajto · J. Non-Cryst. Solids · 1991 · 137–138 · 49910.1016/S0022-3093(05)80164-4 ↗
2. Yun · Appl. Phys. Lett. · 1993 · 63 · 249310.1063/1.110459 ↗
3. Jafar · Phys. Rev. B · 1993 · 47 · 1091110.1103/PhysRevB.47.10911 ↗
4. Wharam · J. Phys. C · 1988 · 60 · 848
5. Hajto · Appl. Surf. Sci. · 1996 · 92 · 57910.1016/0169-4332(95)00299-5 ↗
6. Hajto · Phys. Rev. Lett. · 1991 · 66 · 191810.1103/PhysRevLett.66.1918 ↗