Comparison of rapid ramp voltage and tunnelling injection stress experiments for the characterization of thin MOS gate oxides
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OpenAlex topics: Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis · Advancements in Semiconductor Devices and Circuit Design
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References (7)
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6. Van der Schoot · INFOS · 1983 · 270
7. Apte · J. Electrochem. Soc. · 1993 · 14010.1149/1.2056156 ↗