journal article·2012-01

Carbon-K NEXAFS measurements of a-CN films formed from decomposition of BrCN in electron cyclotron resonance plasmas of He, Ne, and Ar

Akira Wada, Katsuaki Koshimura, Masahito Niibe, Hidetoshi Saitoh, Kazuhiro Kanda, Haruhiko Ito

Journal of Non-Crystalline Solids· Volume 358· Issue 1
Publisher page

Abstract

Abstract Amorphous carbon nitride ( a -CN x ) films were formed from the decomposition of BrCN in the electron cyclotron resonance plasmas of He, Ne, and Ar. The local structures of these films were investigated by the carbon-K near edge X-ray absorption fine structure. It was found that the density of C=C bond in the film prepared with Ar plasma was 7–9 times larger than that with He or Ne plasmas. The [N]/([C] + [N]) ratios of films were estimated from the X-ray photoelectron spectra as 0.34 ± 0.05, 0.35 ± 0.04, and 0.28 ± 0.05 for the He, Ne, and Ar plasmas, respectively. It was found that C atoms in the sp 2 -hybridized state were incorporated into the two-dimensional and/or one-dimensional conjugated structures composed of − C=N− in the cases of the He and Ne plasmas and of − C=C− in the case of the Ar plasma. The compositions and the local structures of films can be explained in terms of a model based on the cyclazine-like network structures.
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Research context

OpenAlex topics: Diamond and Carbon-based Materials Research · Metal and Thin Film Mechanics · Semiconductor materials and devices

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