Determination of the flatband voltage and the electron threshold voltage of a-Si:H based MIS structures by the feedback charge C–V method
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OpenAlex topics: Thin-Film Transistor Technologies · Semiconductor materials and interfaces · Semiconductor materials and devices
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References (4)
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2. Mego · Rev. Sci. Instrum. · 1986 · 57 · 279810.1063/1.1139046 ↗
3. Thurzo · Rev. Sci. Instrum. · 1994 · 65 · 224410.1063/1.1144734 ↗
4. Crandall · Phys. Rev. B · 1987 · 36 · 246510.1103/PhysRevB.36.2645 ↗