In situ characterization of chemically deposited nickel thin films on float glass by ellipsometry
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Abstract
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Research context
OpenAlex topics: Thermal Radiation and Cooling Technologies · Optical Coatings and Gratings · nanoparticles nucleation surface interactions
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References (9)
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1. 1978 · 71
2. Lampert · Solar Wind Technol. · 1987 · 4 · 34710.1016/0741-983X(87)90067-1 ↗
3. Hilfiker · Thin Solid Films · 1995 · 270 · 7310.1016/0040-6090(95)06851-1 ↗
4. de Minjer · J. Electrochem. Soc. · 1973 · 120 · 164410.1149/1.2403321 ↗
5. Przyluski · Surf. Coatings Technol. · 1987 · 31 · 20310.1016/0257-8972(87)90073-9 ↗
6. Ellipsometry and Polarized Light
7. Yamamoto · Appl. Opt. · 1992 · 31 · 161210.1364/AO.31.001612 ↗
8. Optical Interference Coatings
9. Aspnes · Thin Solid Films · 1982 · 89 · 24910.1016/0040-6090(82)90590-9 ↗