Origin of the anomalous pulse-width dependence in capacitance transient measurements on n-type a-Si:H
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OpenAlex topics: Semiconductor materials and interfaces · Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies
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References (8)
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5. Branz · Phys. Rev. · 1993 · B48 · 866710.1103/PhysRevB.48.8667 ↗
6. Jackson · 1995 · 337 · 233
7. Jackson · Phys. Rev. · 1995 · B52 · R223310.1103/PhysRevB.52.R2233 ↗
8. Lang · 1979 · Vol. 37