Structural memory model of slow defect relaxation in hydrogenated amorphous silicon
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Phase-change materials and chalcogenides · Silicon and Solar Cell Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (12)
Show source-provided references
1. Cohen · Phys. Rev. Lett. · 1992 · 69 · 335810.1103/PhysRevLett.69.3358 ↗
2. Carlen · Phys. Rev. · 1995 · B51 · 217310.1103/PhysRevB.51.2173 ↗
3. Jackson · 1995 · 233
4. Branz · 1994 · 129
5. Fedders · J. Non-Cryst. Solids · 1995 · 190 · 14210.1016/0022-3093(95)00267-7 ↗
6. Unold · 1995 · 293
7. Toyozawa · Physica · 1983 · 116B · 7
8. Branz · Phys. Rev. · 1993 · B48 · 866710.1103/PhysRevB.48.8667 ↗
9. Moss · 1970 · 658
10. Branz · Phys. Rev. · 1989 · B39 · 510710.1103/PhysRevB.39.5107 ↗
11. E.A. Schiff, private communication.
12. Rivier · Philos. Mag. · 1979 · A40 · 859