journal article·1989-12Open access

Material parameters in thick hydrogenated amorphous silicon radiation detectors

S. Quereshi, V. Perez-Mendez, S.N. Kaplan, I. Fujieda, G. Cho, R.A. Street

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Glass properties and applications

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References (6)

Show source-provided references
1. Qureshi · IEEE Transactions on Nuclear Science · 1989 · 36 · 19410.1109/23.34433 ↗
2. Perez-Mendez · NIM · 1988 · 273 · 12710.1016/0168-9002(88)90807-8 ↗
3. Street · Phys. Rev. B · 1983 · 27 · 492410.1103/PhysRevB.27.4924 ↗
4. Street · Phil. Mag. B · 1984 · 49 · L1510.1080/13642818408246494 ↗
5. Street · Appl. Phys. Lett. · 1982 · 41 · 106010.1063/1.93400 ↗
6. Street · 1989