journal article·2007-09

Electron energy-loss spectroscopy in irradiation-sensitive rutile-GeO2

Nan Jiang, John C.H. Spence

Journal of Non-Crystalline Solids· Volume 353· Issue 29
Publisher page

Abstract

Abstract This report suggests that an electron energy-loss spectroscopy technique under low beam intensity is useful for beam-sensitive materials. High quality ‘damage-free’ Ge M 45 edge near-edge structure can be obtained using this method in rutile-GeO 2 , which is susceptible to high-energy electron beam damage. Both experimental and theoretical results indicate that the Ge M 45 edge ELNES can be used to distinguish fourfold and sixfold coordinated Ge.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis · Semiconductor materials and devices

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