Physical aspects in glass surface analysis
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Abstract
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis · Radiation Effects in Electronics
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References (7)
Show source-provided references
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3. Mazzoldi · Rad. Eff. · 1986 · 98 · 205
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5. Menzel · Nucl. Instr. Meth. · 1986 · B13 · 50710.1016/0168-583X(86)90557-4 ↗
6. Wang · J. Vac. Science Tech. · 1984 · A2 · 73210.1116/1.572560 ↗
7. Mazzoldi · Nucl. Instr. Meth. · 1983 · 209 · 108910.1016/0167-5087(83)90924-9 ↗