Investigation of interface state density between a-Si:H and insulating layers by ESR and photothermal deflection spectroscopy
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Cultural Heritage Materials Analysis · Silicon Nanostructures and Photoluminescence
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (14)
Show source-provided references
1. Umezu · 1995 · Vol. 377 · 9
2. Umezu · Jpn. J. Appl. Phys. · 1994 · 33 · L87310.1143/JJAP.33.L873 ↗
3. Smith · Appl. Phys. Lett. · 1987 · 50 · 152110.1063/1.97819 ↗
4. Xu · Jpn. J. Appl. Phys. · 1987 · 26 · L181810.1143/JJAP.26.L1818 ↗
5. Frye · Appl. Phys. Lett. · 1987 · 12 · 10110.1063/1.97866 ↗
6. Min · Appl. Phys. Lett. · 1995 · 66 · 271810.1063/1.113499 ↗
7. Jackson · Phys. Rev. · 1982 · B25 · 555910.1103/PhysRevB.25.5559 ↗
8. Krick · Appl. Phys. Lett. · 1987 · 51 · 60810.1063/1.98362 ↗
9. Griscom · Solid State Commun. · 1974 · 15 · 47910.1016/0038-1098(74)91124-7 ↗
10. Rothschild · Appl. Phys. Lett. · 1989 · 55 · 127610.1063/1.102471 ↗
11. Kanicki · J. Non-Cryst. Solids · 1993 · 164–166 · 105510.1016/0022-3093(93)91180-B ↗
12. Pauling · 1960
13. Smith · J. Electrochem. Soc. · 1993 · 140 · 149610.1149/1.2221586 ↗
14. Smith · J. Electrochem. Soc. · 1990 · 137 · 61410.1149/1.2086517 ↗