Influence of annealing on the physical properties and atomic structure of a-Si: H films
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Glass properties and applications · Surface Roughness and Optical Measurements
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (6)
Show source-provided references
1. Tsai · 1977 · 339
2. Voget-Grote · Phil. Mag. B. · 1980 · 41 · 12710.1080/13642818008245375 ↗
3. Davis · Phil. Mag. · 1970 · 22 · 90310.1080/14786437008221061 ↗
4. Lucovsky · Phys. Rev. B · 1979 · 19 · 206410.1103/PhysRevB.19.2064 ↗
5. Mosseri · J. Non-crystalline Solids · 1980 · 35& 36 · 50710.1016/0022-3093(80)90645-6 ↗
6. Paesler · 1974 · 229