Characterization of microcrystalline silicon by Hall and photo-Hall measurements
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · CCD and CMOS Imaging Sensors
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. Matsui · J. Appl. Phys. · 1982 · 53 · 99510.1063/1.330580 ↗
2. Dresner · Appl. Phys. Lett. · 1980 · 37 · 74210.1063/1.92017 ↗
3. Baccarani · J. Appl. Phys. · 1978 · 49 · 556510.1063/1.324477 ↗