journal article·2006-07

Structural relaxation in sputter-deposited silica glass

Tomohiro Hirose, Kazuya Saito, Akira J. Ikushima

Journal of Non-Crystalline Solids· Volume 352· Issue 21-22
Publisher page

Abstract

Abstract We investigated structural relaxation below the glass transition temperature in sputter-deposited silica glass. Structural relaxation was obtained from annealing behavior of the IR reflection structural band position. Results were compared with that of bulk silica glass. Results showed the following. (1) The structural relaxation time is 106 times shorter than that of bulk silica glass. (2) The activation energy is close to that of bulk silica glass. (3) Once the structural relaxation reaches a steady state, the structure of silica glass film resembles that of bulk silica glass.
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Research context

OpenAlex topics: Glass properties and applications · Luminescence Properties of Advanced Materials · Mineralogy and Gemology Studies

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