journal article·1993-12

Light and current degradation of a-Si:H pin, nin and pip diodes detected with CPM

H.-C. Ostendorf, W. Kusian, W. Krühler, R. Schwarz

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies

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References (6)

Show source-provided references
1. Staebler · Appl. Phys. Lett. · 1977 · 31 · 29210.1063/1.89674 ↗
2. Stutzmann · Phys. Rev. B · 1985 · 32 · 2310.1103/PhysRevB.32.23 ↗
3. Vaněček · Solar Energy Mat. · 1983 · 8 · 41110.1016/0165-1633(83)90006-0 ↗
4. Pierz · J. Non-Cryst. Solids · 1987 · 97&98 · 6310.1016/0022-3093(87)90014-7 ↗
5. Ostendorf · 1993
6. Krühler · 1984 · Vol. 120 · 311