Spectrometric and ellipsometric studies of (1 −x)TiO2·xLn2O3 (Ln = Nd, Sm, Gd, Er, Yb) thin films
Source abstract
Abstract
Spectrometric and ellipsometric studies of (1 − x)TiO2 ? xLn2O3 (Ln = Nd, Sm, Gd, Er, Yb ; x = 0.33, 0.5) thin films at room temperature were performed. The obtained dispersion dependences of refractive indices are successfully described by the optical-refractometric relation. The dependence of optical pseudogap and refractive indices on composition and molar mass of the films is investigated. The influence of compositional disordering on the energy width of the exponential absorption edge is studied.
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Research context
OpenAlex topics: Electrical and Thermal Properties of Materials · Optical and Acousto-Optic Technologies · Ferroelectric and Piezoelectric Materials
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