journal article·1998-05

Characterization of nitrogen in a-CN thin films by gas effusion spectroscopy

Shigeru Yoshida, Takashi Itoh, Naoyuki Takada, Shoji Nitta, Shuichi Nonomura

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Diamond and Carbon-based Materials Research · Semiconductor materials and devices · High-pressure geophysics and materials

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References (9)

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3. Nitta · J. Non-Cryst. Solids · 1998 · 227–230 · 65510.1016/S0022-3093(98)00191-4 ↗
4. Zhang · Mat. Res. Soc. Symp. Proc. · 1995 · 388 · 27110.1557/PROC-388-271 ↗
5. Itoh · J. Appl. Phys. · 1996 · 80 · 602810.1063/1.363602 ↗
6. Itoh · Diamond Films Technol. · 1996 · 6 · 293
7. Beyer · J. Appl. Phys. · 1982 · 53 · 874510.1063/1.330474 ↗
8. L. Pan, M. Zhang, Y. Nakayama, Extended Abstract of The Japan Society of Appl. Phys. Autumn Meeting, No. 2 (1996) 417 (in Japanese).
9. T. Itoh, S. Yoshida, S. Nitta, N. Takada, S. Nonomura, Proc. of 2nd International Conference of Nitride Semiconductors, in print.