Morphological and crystallographic defect properties of microcrystalline silicon: a comparison between different growth modes

journal article·1998-05

L. Houben, M. Luysberg, P. Hapke, O. Vetterl, F. Finger, R. Carius, H. Wagner

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OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Semiconductor materials and devices

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