journal article·1993-12

Limits of the Constant Photocurrent Method (CPM) for the determination of the deep defect density in amorphous hydrogenated silicon (a-Si:H)

Andreas Mettler, Nicolas Wyrsch, Arvind Shah

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Thermography and Photoacoustic Techniques · Silicon Nanostructures and Photoluminescence

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References (9)

Show source-provided references
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4. Curtins · 1987 · 7 · 267
5. N. Beck, N. Wyrsch, E. Sauvain, and A. Shah, proc. MRS Spring Meeting 1993, San Francisco, to be published
6. Rose · 1963
7. Bube · J. Appl. Phys. · 1992 · 72 · 576610.1063/1.351931 ↗
8. Gu · Phil. Mag. B · 1986 · 53 · 32110.1080/01418638608244291 ↗
9. Gunes · 1993