Scanning probe microscopic investigations of amorphous tellurium subhalides

Abstract This work reports on tellurium subhalide surfaces investigated by means of atomic force and scanning tunnelling microscopy (AFM/STM). Characteristic structural features on the submicrometer length scale are presented for amorphous TeCl and Te 2 Br 0.75 I 0.25 samples. Atomically resolved images show both disordered and periodic structures. Interatomic distances are compared with those of crystalline compounds as well as results of X-ray diffraction measurements. Upon thermal treatment under ultra high vacuum conditions decomposition in competition with recrystallization takes place.