journal article·1998-05

Structural defects and hydrogen clustering in amorphous silicon

S Acco, D.L Williamson, S Roorda, W.G.J.H.M van Sark, A Polman, W.F van der Weg

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon Nanostructures and Photoluminescence · Silicon and Solar Cell Technologies

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References (9)

Show source-provided references
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2. Hiroyama · Appl. Phys. Lett. · 1996 · 68 · 312610.1063/1.115799 ↗
3. Acco · Phys. Rev. B · 1996 · 53 · 441510.1103/PhysRevB.53.4415 ↗
4. Davis · J. Non-Cryst. Solids · 1996 · 198–200 · 110.1016/0022-3093(95)00638-9 ↗
5. van Sark · Mater. Res. Soc. Symp. Proc. · 1996 · 420 · 2110.1557/PROC-420-21 ↗
6. Williamson · Mater. Res. Soc. Symp. Proc. · 1995 · 377 · 25110.1557/PROC-377-251 ↗
7. Williamson · Appl. Phys. Lett. · 1995 · 67 · 22610.1063/1.114675 ↗
8. L.H. Schwartz, J.B. Cohen, Diffraction from Materials, Springer, Berlin, 1987, p. 402.10.1007/978-3-642-82927-7 ↗
9. S. Acco, D.L. Williamson et al., submitted.