journal article·1987-12

A unified scheme of interpretation of the X-ray absorption spectra used as structural probe

M. Benfatto, C.R. Natoli

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: X-ray Diffraction in Crystallography · Thermodynamic and Structural Properties of Metals and Alloys · Scientific Measurement and Uncertainty Evaluation

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References (12)

Show source-provided references
1. Natoli · Journal de Physique · 1986 · 47 · C8-11
2. Schaich · Phys. Rev. B · 1984 · 29 · 651310.1103/PhysRevB.29.6513 ↗
3. Benfatto · Phys. Rev B · 1986 · 34 · 577410.1103/PhysRevB.34.5774 ↗
4. Durham · Solid State Comm. · 1981 · 38 · 15910.1016/0038-1098(81)90811-5 ↗
5. M. Benfatto, C.R. Natoli and M. Ruiz, manuscript in preparation.
6. Rehr · 1985
7. Bunker · Nuclear Instruments and Methods · 1983 · 207 · 43710.1016/0167-5087(83)90655-5 ↗
8. Lagarde · Journal de Physique · 1986 · 4710.1051/jphys:019860047080138900 ↗
9. Sayers · Journal de Physique · 1986 · 47 · C8-349
10. A. Bianconi, A.Di Cicco, N.V. Pavel, M. Benfatto, A. Marcelli, C.R. Natoli, P. Pianetta and J. Woicik in " Multiple Scattering Effects in the K-edge X-ray Absorption Near Edge Structure of Crystal and Amorphous Silicon" submitted to Phys. Rev B and references therein.
11. Balerna · Journal de Physique · 1986 · 47 · C8-6310.1051/jphys:01986004705086300 ↗
12. M. Benfatto, unpublished results.