The application of very high frequency inductively coupled plasma to high-rate growth of microcrystalline silicon films

Abstract High-rate growth of microcrystalline silicon films (μc-Si:H) from inductively coupled plasma (ICP) of H2 diluted SiH4 generated with a very high frequency (VHF: 60 MHz) power source has been studied from the viewpoint of efficient gas dissociation. From the VHF power and gas pressure dependences of the film growth rate and optical emission intensities, we have found that the Si and SiH emission intensities and the intensity ratio of Hα to SiH are good indicators for the film growth rate and crystallinity, respectively. The generation rate of film precursors is reflected by the Si and SiH emission intensities while the flux ratio of atomic hydrogen to film precursors, which plays an important role on the structural relaxation for the crystalline network formation, is characterized by the intensity ratio of Hα to SiH. An increase in SiH emission while keeping the intensity ratio of Hα to SiH at a certain level enables us to enhance the film growth rate without significant deterioration in the crystallinity. In this study, a growth rate as high as 10 nm/s was obtained for highly crystallized films.