journal article·1995-07

Silicon oxynitride study by the tetrahedron model and by spectroscopic ellipsometry

A. Sassella, P. Lucarno, A. Borghesi, F. Corni, S. Rojas, L. Zanotti

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Semiconductor materials and devices · Diamond and Carbon-based Materials Research

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References (8)

Show source-provided references
1. Borghesi · Appl. Phys. · 1993 · A56 · 14710.1007/BF00517682 ↗
2. Sassella · 1993 · 2089 · 398
3. Lanford · J. Appl. Phys. · 1978 · 49 · 247310.1063/1.325095 ↗
4. Rojas · J. Vac. Sci. Technol. · 1993 · B11 · 208110.1116/1.586546 ↗
5. Aspnes · J. Appl. Phys. · 1979 · 50 · 492810.1063/1.325596 ↗
6. Sassella · Phys. Rev. · 1993 · B48 · 1420810.1103/PhysRevB.48.14208 ↗
7. Borghesi · Thin Solid Films · 1993 · 233 · 22710.1016/0040-6090(93)90096-8 ↗
8. Bruggeman · Ann. Phys. (Leipzig) · 1935 · 24 · 63610.1002/andp.19354160705 ↗