GAP-State distribution in Ge25Se75-xBix sputtered films by phase shift analysis of modulated photocurrents
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Phase-change materials and chalcogenides · Liquid Crystal Research Advancements · Chalcogenide Semiconductor Thin Films
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. Nagels · J. Non-Cryst. Sol. · 1983 · 59–60 · 101510.1016/0022-3093(83)90339-3 ↗
2. Mytilineou · J. of Phys. Condensed Matter. · 1989 · 1 · 468710.1088/0953-8984/1/28/018 ↗
3. Oheda · J. Appl. Phys. · 1981 · 52 · 669310.1063/1.328619 ↗
4. Brüggemann · Phil. Mag. B · 1990 · 62 · 2910.1080/13642819008205532 ↗
5. Kounavis · J. Non-Cryst. Sol. · 1989 · 114 · 10310.1016/0022-3093(89)90082-3 ↗