Frequency-resolved spectroscopy and its application to lifetime studies in a-Si:H
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Silicon and Solar Cell Technologies · Thin-Film Transistor Technologies · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (9)
Show source-provided references
1. Street · Advances in Physics · 1981 · 30 · 59310.1080/00018738100101417 ↗
2. Bort · Phil Mag. Lett · 1991 · 64 · 22710.1080/09500839108214547 ↗
3. Stachowitz · J. Non-Cryst. Sol. · 1991 · 137&138 · 55110.1016/S0022-3093(05)80177-2 ↗
4. Depinna · Phil. Mag. B · 1984 · 50 · 57910.1080/13642818408238880 ↗
5. Street · Phys. Rev. · 1978 · B18 · 188010.1103/PhysRevB.18.1880 ↗
6. Searle · 1987 · 357
7. Ambros · J. Non-Cryst. Sol. · 1991 · 137&138 · 55510.1016/S0022-3093(05)80178-4 ↗
8. Tsang · Phys. Rev. · 1979 · B19 · 302710.1103/PhysRevB.19.3027 ↗
9. Shklovskii · Phys. Rev. Lett. · 1989 · 62 · 298910.1103/PhysRevLett.62.2989 ↗