In Situ characterization of chemical annealing of a-Si:H by photoelectron spectroscopy
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Abstract
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Research context
OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Silicon Nanostructures and Photoluminescence
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References (9)
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1. Shirai · Appl. Phys. Lett. · 1991 · 59 · 109610.1063/1.106355 ↗
2. Ley · 1984 · Vol. II
3. Ley · 1985
4. Winer · 1988
5. Griep · J. Non-Cryst. Solids · 1983 · 59 & 60 · 25310.1016/0022-3093(83)90569-0 ↗
6. Jin · Phys. Rev. B · 1991 · 44 · 106610.1103/PhysRevB.44.1066 ↗
7. Winer · Phys. Rev. B · 1990 · 41 · 1215010.1103/PhysRevB.41.12150 ↗
8. Smith · Phys. Rev. Lett. · 1987 · 59 · 68810.1103/PhysRevLett.59.688 ↗
9. Stutzmann · Phil. Mag. B · 1987 · 56 · 6310.1080/13642818708211224 ↗