journal article·1992

The amorphous SiO : H thin film system. III. Structure and bonding

A. Singh, S.C. Bayliss, S.J. Gurman, E.A. Davis

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Glass properties and applications · X-ray Spectroscopy and Fluorescence Analysis · Thin-Film Transistor Technologies

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References (25)

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