Annealing temperature dependence of the optical properties of sputtered hydrogenated amorphous silicon carbide
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OpenAlex topics: Thin-Film Transistor Technologies · Semiconductor materials and devices · ZnO doping and properties
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References (16)
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1. Street · Philos. Mag. · 1987 · B56 · 30510.1080/13642818708221319 ↗
2. Solomon · 1987 · 344
3. Anderson · Philos. Mag. · 1977 · B35 · 110.1080/14786437708235967 ↗
4. Demichelis · Appl. Opt. · 1987 · 26 · 171710.1364/AO.26.001737 ↗
5. Cody · 1984 · Vol. 21 · 11
6. Piller · 1985 · 571
7. Edwards · 1985 · 547
8. Choyke · 1985 · 587
9. Penn · Phys. Rev. · 1962 · 128 · 209310.1103/PhysRev.128.2093 ↗
10. Wemple · Phys. Rev. · 1971 · B3 · 133810.1103/PhysRevB.3.1338 ↗
11. Weakliem · J. Appl. Phys. · 1979 · 50 · 149110.1063/1.326135 ↗
12. Jellison · Appl. Phys. Lett. · 1982 · 41 · 18010.1063/1.93454 ↗
13. Tauc · Phys. Status Solidi · 1966 · 15 · 62710.1002/pssb.19660150224 ↗
14. Properties of Amorphous Silicon
15. Kramers · 1927
16. Kronig · Ned. Tijdschr. Natuurk. · 1942 · 9 · 402