X-ray reflectivity: a new tool for the study of glass surfaces
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Surface Roughness and Optical Measurements · Glass properties and applications · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (12)
Show source-provided references
1. Doremus · J. Mater. Sci. · 1983 · 18 · 61210.1007/BF00560651 ↗
2. Vigil · J. Coll. Interf. Sci. · 1994 · 165 · 36710.1006/jcis.1994.1242 ↗
3. Rudd · J. Am. Ceram. Soc. · 1993 · 76 · 255510.1111/j.1151-2916.1993.tb03981.x ↗
4. Parratt · Phys. Rev. · 1954 · 95 · 35910.1103/PhysRev.95.359 ↗
5. Névot · Rev. Phys. Appl. · 1976 · 11 · 11310.1051/rphysap:01976001101011300 ↗
6. Névot · Rev. Phys. Appl. · 1980 · 15 · 76110.1051/rphysap:01980001503076100 ↗
7. Hüppauff · J. Appl. Phys. · 1994 · 75 · 78510.1063/1.356430 ↗
8. Pershan · Phys. Rev. Lett. · 1984 · 52 · 75910.1103/PhysRevLett.52.759 ↗
9. Russell · Mater. Sci. Rep. · 1990 · 5 · 17110.1016/S0920-2307(05)80002-7 ↗
10. J.M. Grimal, P. Chartier and P. Lehuédé, to be published.
11. Schalchli · Europhys. Lett. · 1994 · 26 · 27110.1209/0295-5075/26/4/006 ↗
12. Pantano · 1993 · 285