Saturation and recovery kinetics of current-induced defects in a-Si:H
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (9)
Show source-provided references
1. Stutzmann · Phys. Rev. · 1985 · B32 · 2310.1103/PhysRevB.32.23 ↗
2. Redfield · Appl. Phys. Lett. · 1989 · 54 · 103710.1063/1.100790 ↗
3. Street · Appl. Phys. Lett. · 1990 · 57 · 133410.1063/1.103475 ↗
4. Crandall · Phys. Rev. · 1987 · B36 · 264510.1103/PhysRevB.36.2645 ↗
5. Fortmann · J. Non-cryst. solids · 1989 · 114 · 62410.1016/0022-3093(89)90670-4 ↗
6. R. A. Street, Appl. Phys. Lett., in print.
7. R. A. Street and M. Hack MRS Symp Proc. in print.
8. Winborne · 1988 · 118 · 501
9. J. G. Shaw, M. Hack, P. G. LeComber and M. Willums, these proceedings.