journal article·1980-01

Glow discharge optical spectroscopy measurement of dopant concentrations in a-Si:H

J.C. Zesch, R.A. Lujan, V.R. Deline

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Thin-Film Transistor Technologies · Silicon and Solar Cell Technologies · Silicon Nanostructures and Photoluminescence

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References (11)

Show source-provided references
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4. Greene · J. Appl. Phys. · 1975 · 46 · 270110.1063/1.321906 ↗
5. Glow Discharge Optical Spectroscopy for Measurement of Boron Implanted Distributions in Silicon
6. Comas · J. Appl. Phys. · 1967 · 38 · 295610.1063/1.1710031 ↗
7. Canghey · 1967 · 55 · 2192
8. Wagner · J. Electrochem. Soc. · 1972 · 119 · 157010.1149/1.2404044 ↗
9. Thurber · 1978 · 81
10. Gibbons · 1975
11. Street · Phys. Rev. B · 1978 · 18 · 188010.1103/PhysRevB.18.1880 ↗