journal article·1997-09

Mechanical stress in thin SiO2 and Ta2O5 films produced by reactive-low-voltage-ion-plating (RLVIP)

Georg N. Strauss, Nguyen Quang Danh, H.K. Pulker

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Metal and Thin Film Mechanics · Diamond and Carbon-based Materials Research · Ion-surface interactions and analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (8)

Show source-provided references
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2. Pulker · 1984
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4. Edlinger · 1990
5. Mattox · J. Vac. Sci. Technol. · 1972 · 9 · 52810.1116/1.1316677 ↗
6. Carter · J. Phys. · 1994 · D27 · 1046
7. Lindinger · Pure Appl. Chem. · 1985 · 57 · 122310.1351/pac198557091223 ↗
8. Pulker · J. Vac. Sci. Technol. · 1992 · A10 · 166910.1116/1.577767 ↗