journal article·1995-07

Effects of iron contamination in silicon on thin oxide breakdown and reliability characteristics

Worth B. Henley, Lubek Jastrzebski, Nadim F. Haddad

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Silicon and Solar Cell Technologies · Semiconductor materials and devices · Advancements in Semiconductor Devices and Circuit Design

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