Atom probe FIM investigation of voids in a-Ge
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Abstract
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Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Ion-surface interactions and analysis · Laser-induced spectroscopy and plasma
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References (25)
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20. Krishnaswamy, S. V., Messier, R., Ng, Yee S. and Tsong, T. T., to be published.
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24. Krishnaswamy, S. V., Messier, R., and Barber, D. J., to be published.
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