Stress measurement of glow discharge produced a-Ge:H thin films and its relation to electronic and structural properties
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Thin-Film Transistor Technologies · ZnO doping and properties · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (9)
Show source-provided references
1. Paesler · 1974 · Vol. 1 · 229
2. Stutzmann · Appl. Phys. Lett. · 1985 · 47 · 2110.1063/1.96415 ↗
3. Spear · Phil. Mag. B · 1986 · 54 · 34310.1080/13642818608236853 ↗
4. Stevens · 1991
5. P. Wickboldt, S.J. Jones, F.C. Marques, D. Pang, W.A. Turner, A.E. Wetsel, W. Paul and J.H. Chen, Phil. Mag., in print.
6. Turner · J. Appl. Phys. · 1990 · 67 · 743010.1063/1.344533 ↗
7. Paduscheck · Thin Solid Films · 1983 · 110 · 29110.1016/0040-6090(83)90510-2 ↗
8. Doerner · Crit. Rev. in Sol. St. and Mat. Sci. · 1988 · 14 · 225
9. Harbison · J. Appl. Phys. · 1984 · 55 · 94610.1063/1.333148 ↗