journal article·1985-12

Nitrogen bonding changes versus substrate temperature evidenced by X.P.S. in SiNxHy alloys prepared with NH3

L Kubler, R Haug, J.J Koulmann, D Bolmont, K Hill, A Jaegle

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Semiconductor materials and devices · Thin-Film Transistor Technologies · Copper Interconnects and Reliability

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References (12)

Show source-provided references
1. Chayahara · Jap. J. Appl. Phys. · 1985 · 24 · 1910.1143/JJAP.24.19 ↗
2. Bouchier · J. Electrochem. Soc. · 1983 · 130 · 64210.1149/1.2119772 ↗
3. Raider · J. Electrochem. Soc. · 1976 · 123 · 56010.1149/1.2132877 ↗
4. Chin · J. Vac. Sci. Technol. · 1975 · 12 · 82110.1116/1.568680 ↗
5. Maillot · J. Vac. Sci. Technol B · 1984 · 2 · 31610.1116/1.582816 ↗
6. Kurata · Jpn. J. Appl. Phys. · 1981 · 20 · 64210.1143/JJAP.20.L811 ↗
7. Ibaraki · Phys. Rev. B · 1984 · 30 · 579110.1103/PhysRevB.30.5791 ↗
8. Karcher · Phys. Rev. B · 1984 · 30 · 189610.1103/PhysRevB.30.1896 ↗
9. L. KUBLER, J.J. KOULMANN, R. HAUG and A. JAEGLE, Poly-Micro-Crystalline and Amorphous Semiconductors (M.R.S. Conf., STRASBOURG, 84, Les Editions de Physique) pp 645.
10. Kubler · Solid State Comm · 1983 · 48 · 6110.1016/0038-1098(83)90184-9 ↗
11. Egawa · Surface Science · 1983 · 131 · 4910.1016/0039-6028(83)90119-X ↗
12. Isu · Solid State Comm. · 1983 · 42 · 447